SPM-8100FM - Especificações

High-Resolution Scanning Probe Microscope

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Observation mode

Contact, dynamic (AM method and FM method), lateral force (LFM)
Resolução

Horizontal: 0.2 nm; Vertical: 0.01 nm
SPM head

Displacement detection system: Light source, optical lever, detector Light source: Laser diode (ON/OFF) Irradiates a cantilever continuously even while replacing samples Detector: Photodetector
{"title":"Downloads das folhas de especifica\u00e7\u00f5es","description":"Baixe as folhas de especifica\u00e7\u00f5es mais recentes.","source":"product","key":3503,"max":30,"filter_types":["spec_sheet"],"link_title":"Ver outros downloads","link_url":""} {"title":"Downloads","description":"Baixe o cat\u00e1logo mais recente","source":"product","key":3503,"max":30,"filter_types":["brochures"],"link_title":"Ver outros downloads","link_url":"","pdf_links":[]}