High-Resolution Scanning Probe Microscopes Comparison

This page provides a quick overview of 3 models of high-resolution Scanning Probe Microscopes . Choose the model that best suits your analysis needs from our multi-function model SPM-9700HT, automatic observation model SPM-Nanoa, to research-grade high resolution model SPM-8100FM.

Summary of Product Features
Comparison Table
Movies

1. Summary of Product Features

SPM-9700HT

High-Throughput Scanner Shortens Observation Times
• Acquisition of the image data is available at a speed of conventional than 5 times or more.

Ease of Operation Minimizes Distraction from Observation to Analysis
• Navigation function and other features ensure observations can be performed quickly and smoothly.

Functionality and Expandability to Meet a Wide Range of Requirements
• A generous selection of measurement modes and excellent expandability helps ensure reliable measurements.

SPM-Nanoa

Automatic Observation
• Adjusts laser beam, parameter settings during observation, and performs image processing automatically.

Extensive Functionality
• Capture sharp images with optical microscopy to SPM microscopy modes

Various Support Functionality Achieves Fast Observation
• High-throughput observation and fast physical property mapping

SPM-8100FM

High Resolution
• Noise in air and liquids is reduced to 1/20 that of existing methods.
• Achieves the performance level of a vacuum-type SPM, even in air and liquids.

Improved Usability
• HT scanner extends observation area and shortens observation times.
• Dual monitors and signal indication function provide greater flexibility

2. Comparison Table

Model		SPM-9700HT	SPM-Nanoa	SPM-8100FM
Type		Scanning probe microscope	Scanning probe microscope/ atomic force microscope	High resolution scanning probe microscope
Applications		Biology, metals, minerals, ceramics, non-metals, polymer, powders, nanotechnology, thin films, semiconductors, coating films, batteries
Main function		Multifunction	Multifunction. automatic observation	High resolution observation
Max. sample size		Φ24×8mm	Φ50×8mm	Φ35×8mm
Noise level		Standard	Low	Extremely low
Optical axis adjustment （laser/detector）		Manual	Automatic	Manual
Sample setting		Manual	Automatic	Manual
Observation parameter setting		Manual	Automatic	Manual
Observation modes	Contact
	Dynamic
	Phase
	Force modulation
	Electronic current
	MFM
	KFM
	PFM
	STM
	FM-AFM
	Observation in liquid			*
Physical property mapping function (ZXY scanning)		Elastic modulus/Adhesion	High-speed mapping Elastic modulus/Adhesion	High-speed mapping Hydration/solvation measurement
		SPM-9700HT	SPM-Nanoa	SPM-8100FM

*The functionality of SPM-9700HT is available on a made to order basis.

3. Movies

SPM-9700HT High-Throughput Scanner

Surface Analysis
SPM-Nanoa Scanning Probe Microscope/Atomic Force Microsope

Surface Analysis

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High-Resolution Scanning Probe Microscopes Comparison