Microscópio de Força Atômica (SPM)

Scanning Probe Microscopy (SPM) is a group of techniques, such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM), etc. It is used for observing surfaces at nanoscale level. It is utilized in a wide range of applications such as steel, non-ferrous metals, environmental, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers.

Shimadzu provides a comprehensive product lineup of Scanning Probe Microscopes (SPM), including the SPM-9700HT, boasting high-throughput observations; the SPM-Nanoa, which includes an advanced, highly sensitive detection system and an automatic viewing function; and the SPM-8100FM, capable of ultra-high-resolution observations in air, liquids, and hydration/solvation layers at solid-liquid interfaces.

Learn more about our full lineup and how you can enhance your laboratory performance below.